- DLTS
- Deep Level Transient Spectroscopy (Academic & Science » Electronics)* Data Link Test Set (Governmental » Military)
Abbreviations dictionary. 2012.
DLTS
Look at other dictionaries:
Deep-level transient spectroscopy — (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors. DLTS establishes fundamental defect parameters and measures their concentration in the material. Some of the parameters are … Wikipedia
Thermally stimulated current — (TSC) spectroscopy is an important technique used to study energy levels in semiconductors or insulators (organic or inorganic). Energy levels are first filled either by optical or electrical injection usually at a relatively low temperature,… … Wikipedia
Semiconductor device — Semiconductor devices are electronic components that exploit the electronic properties of semiconductor materials, principally silicon, germanium, and gallium arsenide. Semiconductor devices have replaced thermionic devices (vacuum tubes) in most … Wikipedia
Schottky barrier — A Schottky barrier is a potential barrier formed at a metal semiconductor junction which has rectifying characteristics, suitable for use as a diode. The largest differences between a Schottky barrier and a p n junction are its typically lower… … Wikipedia
DVD authoring — Optical discs Optical disc Optical disc drive Optical disc authoring Authoring software Recording technologies Recording modes Packet writing Optical media types … Wikipedia
List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy … Wikipedia
Failure analysis — is the process of collecting and analyzing data to determine the cause of a failure. It is an important discipline in many branches of manufacturing industry, such as the electronics industry, where it is a vital tool used in the development of… … Wikipedia
Capacitance voltage profiling — The CV , or more correctly C V , in C V profiling, stands for capacitance voltage, and refers to a technique used for characterization of semiconductor materials and devices. The technique uses a metal semiconductor junction (Schottky barrier) or … Wikipedia
DLST — Dihydrolipoamide S succinyltransferase (E2 component of 2 oxo glutarate complex) Identifiers Symbols DLST; DLTS External IDs … Wikipedia
Premaster — Das Premaster dient als Vorlage zur Erstellung des Glasmasters für die Vervielfältigung einer CD oder DVD in einem Presswerk. Bei einer CD ROM oder CD Audio handelt es sich dabei um eine CD R, bei einer DVD um eine DVD R oder zwei DLTs (DVD9). Da … Deutsch Wikipedia
