- IDDQ
- Direct Drain Quiescent Current (Academic & Science » Electronics)
Abbreviations dictionary. 2012.
Abbreviations dictionary. 2012.
Iddq testing — is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state (when the circuit is not switching and inputs are held at static values). The… … Wikipedia
PA-7100LC — A PA 7100LC microprocessor. The PA 7100LC is a microprocessor that implements the PA RISC 1.1 instruction set architecture (ISA) developed by Hewlett Packard (HP). It is also known as the PCX L, and by its code name, Hummingbird. It was designed… … Wikipedia
Leakage — describes an unwanted loss, or leak, of something which escapes from its proper location. In everyday usage, leakage is the gradual escape of matter through a leak hole. [ [http://www.m w.com/dictionary/leaking Merriam Webster] ] In different… … Wikipedia
Single Stuck Line — is a fault model used in digital circuits. It is used for post manufacturing testing, not design testing. The model assumes one line or node in the digital circuit is stuck at logic high or logic low. When a line is stuck it is called a fault.… … Wikipedia
Power optimization (EDA) — Power optimization refers to the use of electronic design automation tools to optimize (reduce) the power consumption of a digital design, while preserving the functionality.Introduction and historyThe increasing speed and complexity of today’s… … Wikipedia
Logic redundancy — occurs in a a digital gate network containing circuitry that does not affect the static logic function. There are several reasons why logic redundancy may exist. One reason is that it may have been added deliberately to suppress transient… … Wikipedia